The “Spectral Data Processor” (SDP™) v8.0 is a 32-bit Windows™ (v7−10 compatible) software is provided free of charge to library members. Most software from the instrument makers can import these types of spectra. To view, peak-fit, export, analyze, overlay, process, or print the spectra provided by The XPS Spectra-Base the library member needs a software that can import or directly open spectra having: VAMAS-ISO 14,976 ASCII file format, other ASCII file formats (XY, XYZ), or the SDP binary file format. Currently, “XPS Library” members must download individual sets of spectra or full directories that are stored in ZIP files. Each category name is distinct and is based on the chemistry of the materials.
Multiple data directories belonging to the same category are placed in a directory with the name of that category. Each set of spectra (4–10) is stored inside individual data directories having the name of the material analyzed. The current number of individual spectra in digital form is >70,000 and the number of materials is >9,000. In 1986, this author began to build The XPS Spectra-Base™ by collecting and organizing detailed sets of “self-consistent” monochromatic XPS spectra from reference materials, natural crystals, man-made single crystals, and commercial products. To help the international XPS community and the infrequent users of XPS to overcome these limitations, problems and needs, The XPS Library™ was formed as a non-profit institute to provide an on-line resource of XPS information, self-training material, free >70,000 monochromatic XPS reference spectra, free spectral data processing software, reference tables, links, examples of good and bad peak-fitting, and more. The basics of XPS are taught at a few graduate level courses in universities and there are 3–5 day training courses at conferences, but the need is much greater. These user guides are useful and are published in journals that are known to publish XPS information. Efforts to help new users include journal publications such as self-training guides for peak-fitting, international standards, collections of BEs, examples of peak-fitting, and more. Unfortunately, these publications suffer from a variety of problems in reliability and usefulness because the new authors are not familiar enough with the science and application of XPS, chemical state assignments, and peak-fitting. During the last 15 years ther-e has been an explosive growth in the publication of XPS peak-fits and interpretations. Surface chemical analysis by XPS is more than 60 years old.
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